R. Plantenga

Prismatic Ge-rich inclusions in the hexagonal SiGe shell of GaP-Si-SiGe nanowires by controlled faceting.

E. Bakkers, M. Verheijen, R. Bergamaschini, 2021, Nanoscale.

Exploration of Doped Semiconductors at the Atomic Scale

P. Koenraad, C. Krammel, Alfonso Rodil, 2017, Microscopy and Microanalysis.

Probing impurities at the atomic scale in semiconductor structures

R. Plantenga, 2019 .