S. Gao

发表

Precise measurement of gold nanorods by using depolarized dynamic light scattering apparatus

Miao Sun, Yu-shu Shi, Wei Li, 2021 .

Microwave-induced combustion of graphene for further determination of elemental impurities using ICP-OES and TXRF

W. Haifeng, W. Hai, Yan-Li Han, 2018 .

Measurement accuracy analysis for crystal plane spacing of nitride epitaxial layer by x-ray diffraction

Sitian Gao, Jianjun Cui, Jianjun Cui, 2016, Other Conferences.

Total reflection X-ray fluorescence as a convenient tool for determination of trace elements in microscale gasoline and diesel

W. Hai, Song Xiaoping, Axiang Jin, 2018 .

Automatic real-time compensation of wavelength of heterodyne interferometer

Wei Jin, Yushu Shi, Sitian Gao, 2019, International Symposium on Precision Engineering Measurement and Instrumentation.

Precise measurement of particle size in colloid system based on the development of multiple-angle dynamic light scattering apparatus

Miao Sun, Yu-shu Shi, Wei Li, 2020, Applied Physics B.

Dual-Probe Atomic Force Microscopy based on tuning fork probes for critical dimension metrology.

Xiaojun Liu, Cheng Chen, Yu-shu Shi, 2020, Ultramicroscopy.

Calibration method of curvature distortion in step height measurement by atomic force microscopy

Shu Zhang, Yu-shu Shi, Wei Li, 2020, IOP Conference Series: Materials Science and Engineering.

Active coherent control of nanoscale light confinement: Modulation of plasmonic modes and position of hotspots for surface-enhanced Raman scattering detection

Guofan Jin, S. Fan, Qunqing Li, 2017, Nano Research.

An atomic force microscope head designed for nanometrology

Sitian Gao, Hongtang Gao, Hua Du, 2007 .

Precise measurement of gold nanorods by using depolarized dynamic light scattering apparatus

Yu-shu Shi, Wei Li, Qi Li, 2021, Optoelectronics Letters.

Research on the development and measuring method of nanometre length standard reference material

Xiaodong Hu, Shu Zhang, Yu-shu Shi, 2022 .