Kristof Croes

发表

A. Tsiara, S. A. Srinivasan, S. Balakrishnan, 2020, 2020 Optical Fiber Communications Conference and Exhibition (OFC).

Bart Vandevelde, Eric Beyne, Paul Marchal, 2011, 2011 IEEE International Interconnect Technology Conference.

Francky Catthoor, Mehdi B. Tahoori, Houman Zahedmanesh, 2019, 2019 IEEE International Reliability Physics Symposium (IRPS).

Christopher J. Wilson, Weimin Gao, Ivan Ciofi, 2017, IEEE Transactions on Electron Devices.

Mehdi B. Tahoori, Houman Zahedmanesh, Rajendra Bishnoi, 2020, 2020 IEEE International Reliability Physics Symposium (IRPS).

Ingrid De Wolf, Zsolt Tokei, Kristof Croes, 2019, 2019 IEEE International Reliability Physics Symposium (IRPS).

Houman Zahedmanesh, Odysseas Zografos, Ivan Ciofi, 2021, 2021 ACM/IEEE International Workshop on System Level Interconnect Prediction (SLIP).

Diederik Verkest, Christopher J. Wilson, Aaron Thean, 2016, IEEE Transactions on Electron Devices.

Eric Beyne, Anne Jourdain, Ingrid De Wolf, 2014, 2014 IEEE International Reliability Physics Symposium.

Eric Beyne, Philippe Roussel, Stefaan Van Huylenbroeck, 2015, 2015 IEEE International Interconnect Technology Conference and 2015 IEEE Materials for Advanced Metallization Conference (IITC/MAM).

Guido Groeseneken, Larry Zhao, Zsolt Tokei, 2010, 2010 IEEE International Reliability Physics Symposium.

Eric Beyne, Deniz S. Tezcan, Philippe Soussan, 2011, 2011 IEEE International Interconnect Technology Conference.

Kristof Croes, Mikhail R. Baklanov, Yunlong Li, 2015 .

Eric Beyne, Ingrid De Wolf, Mario Gonzalez, 2016, 2016 IEEE 66th Electronic Components and Technology Conference (ECTC).

Eric Beyne, Ingrid De Wolf, Kristof Croes, 2018, IEEE Transactions on Components, Packaging and Manufacturing Technology.

Houman Zahedmanesh, Kristof Croes, Zsolt Tőkei, 2019, Journal of Applied Physics.

Bart Vandevelde, Eric Beyne, Anne Jourdain, 2012, 2012 4th Electronic System-Integration Technology Conference.

Christopher J. Wilson, Christoph Adelmann, Jürgen Bömmels, 2017, 2017 IEEE International Interconnect Technology Conference (IITC).

Christopher J. Wilson, Christoph Adelmann, Nancy Heylen, 2016, 2016 IEEE International Interconnect Technology Conference / Advanced Metallization Conference (IITC/AMC).

Bart Vandevelde, Riet Labie, Kristof Croes, 2011, 2011 International Reliability Physics Symposium.

Larry Zhao, Gerald Beyer, Zsolt Tokei, 2009, 2009 IEEE International Reliability Physics Symposium.

Christopher J. Wilson, Philippe Roussel, Christoph Adelmann, 2016, ACS applied materials & interfaces.

Christoph Adelmann, Geoffrey Pourtois, Sven Van Elshocht, 2014, IEEE International Interconnect Technology Conference.

Houman Zahedmanesh, Mario Gonzalez, Ivan Ciofi, 2015, 2015 IEEE International Interconnect Technology Conference and 2015 IEEE Materials for Advanced Metallization Conference (IITC/MAM).