Daniel L. Barton

发表

Transient power supply voltage (V/sub DDT/) analysis for detecting IC defects

Paiboon Tangyunyong, Charles F. Hawkins, Jerry M. Soden, 1997, Proceedings International Test Conference 1997.

Active Vertex Model for cell-resolution description of epithelial tissue mechanics

Rastko Sknepnek, Daniel L. Barton, Silke Henkes, 2016, bioRxiv.

Use of the charge-induced voltage alteration technique to analyze precursors to dielectric breakdown

Edward I. Cole, Daniel L. Barton, D. Barton, 1993, Other Conferences.

Local thermal probing to detect open and shorted IC interconnections

Paiboon Tangyunyong, Daniel L. Barton, Edward I. Cole, 1999 .

Integrated Circuit Failure Analysis Hypertext Help System

Kenneth A. Peterson, Ann N. Campbell, J. M. Soden, 1995 .

LDRD final report backside localization of open and shorted IC interconnections LDRD Project (FY98 and FY 99)

Paiboon Tangyunyong, Edward I. Cole, Daniel L. Barton, 2000 .

Optical tools and techniques for failure analysis of modern integrated circuits

Paiboon Tangyunyong, Edward I. Cole, Charles F. Hawkins, 2003, The 16th Annual Meeting of the IEEE Lasers and Electro-Optics Society, 2003. LEOS 2003..

JABAWS 2.2 distributed web services for Bioinformatics: protein disorder, conservation and RNA secondary structure

Fábio Madeira, Geoffrey J. Barton, Peter V. Troshin, 2018, Bioinform..

Editorial

Massimo Vanzi, Daniel L. Barton, Shigeru Nakajima, 2001, Microelectron. Reliab..

Flip-chip and backside techniques seminar : ISTFA '08.

Edward I. Cole, Daniel L. Barton, Karoline Bernhard-Hofer, 2007 .

FASTHELP. Integrated Circuit Failure Analysis Hypertext Help System

Edward I. Cole, Ann N. Campbell, J. M. Soden, 1994 .

Active Vertex Model for cell-resolution description of epithelial tissue mechanics

Rastko Sknepnek, Daniel L. Barton, Silke Henkes, 2017, PLoS Comput. Biol..

Studies of Degradation in Nichia AlGaN/InGaN/GaN Blue Light Emitting Diodes Under Close to Normal Operating Conditions

Marek Osinski, Piotr Perlin, Christopher J. Helms, 1996 .

Degradation of Single-Quantum Well InGaN Green Light Emitting Diodes Under High Electrical Stress

Marek Osinski, Piotr Perlin, Daniel L. Barton, 1996 .

Flip-Chip and Backside Techniques

Edward I. Cole, Daniel L. Barton, Karoline Bernhard-Hofer, 1999, ISTFA 2021: Tutorial Presentations from the 47th International Symposium for Testing and Failure Analysis.

AlGaN/InGaN/GaN blue light emitting diode degradation under pulsed current stress

M. Osinski, Daniel L. Barton, M. Osiński, 1996 .

Novel failure analysis techniques using photon probing with a scanning optical microscope

Edward I. Cole, J. M. Soden, C. L. Henderson, 1994, Proceedings of 1994 IEEE International Reliability Physics Symposium.

Failure analysis for micro-electrical-mechanical systems (MEMS)

Kenneth A. Peterson, Paiboon Tangyunyong, Daniel L. Barton, 1997 .

Role of Nanopipes in Degradation of AlGaN/InGaN/GaN Devices Operating at High Voltage

Marek Osinski, Jinhyun Lee, Daniel L. Barton, 1998 .