Yuping Zeng

Pattern-induced ripple structures at silicon-oxide/silicon interface by excimer laser irradiation

Yihong Wu, Yongfeng Lu, B. Cho, 2002 .

The Effect of Film Thickness on the C40 TiSi2 to C54 TiSi2 Transition Temperature

A. See, Lei Liu, Zexiang Shen, 2005 .

Raman spectroscopy investigation on excimer laser annealing and thickness determination of nanoscale amorphous silicon

B. Cho, Wanxin Sun, Lei Liu, 2004 .