R. Schwenker

发表

High temperature study of yttrium--barium--copper oxides near the YBa2Cu3Ox composition by 111In/Cd time differential \gamma--\gamma perturbed angular correlation spectroscopy

J. A. Gardner, R. Platzer, D. W. Tom, 1997 .

Etch Rate Characterization of Borosilicate Glasses as Diffusion Sources

R. Schwenker, 1971 .

The frequency dependence of sound radiation from mobile dislocation walls

A. Granato, R. Schwenker, 1970 .

Diffusion of arsenic along dislocations in epitaxial silicon films

K. Tu, D. R. Campbell, R. Schwenker, 1975 .

Arsenic Clustering in Silicon

R. F. Lever, Robert Otto Schwenker, R. Lever, 1971 .

Effects of ion implantation on substrate hardening and film stress reduction and their effect on the yield of bipolar transistors

S. Hu, R. Schwenker, 1978 .

Dislocation propagation and emitter edge defects in silicon wafers

S. Klepner, S. Hu, R. Schwenker, 1976 .