Bernd Könemann

Delay Test: The Next Frontier for LSSD Test Systems

Brion L. Keller, T. Williams, Barry K. Rosen, 1992, Proceedings International Test Conference 1992.

A SmartBIST variant with guaranteed encoding

Brion L. Keller, Thomas J. Snethen, Owen Farnsworth, 2001, Proceedings 10th Asian Test Symposium.

Extending OPMISR beyond 10x Scan Test Efficiency

Brion L. Keller, David Scott, Andrew Ferko, 2002, IEEE Des. Test Comput..

Built-In Self-Test: Assuring System Integrity

Najmi T. Jarwala, Benoit Nadeau-Dostie, Ben Bennetts, 1996, Computer.

OPMISR: the foundation for compressed ATPG vectors

Brion L. Keller, Owen Farnsworth, Andrej Ferko, 2001, Proceedings International Test Conference 2001 (Cat. No.01CH37260).

A Test Generation Methodology for High-Performance Computer Chips and Modules

Bernd Könemann, Phil Noto, 1992, Proceedings International Test Conference 1992.

Care bit density and test cube clusters: multi-level compression opportunities

Bernd Könemann, 2003, Proceedings 21st International Conference on Computer Design.

Testable programmable digital clock pulse control elements

Bernd Könemann, Kenneth D. Wagner, 1993, Proceedings of IEEE International Test Conference - (ITC).

AC Test Quality: Beyond Transition Fault Coverage

Paul Chang, Barry K. Rosen, Moshe Leibowitz, 1992, Proceedings International Test Conference 1992.

“ Logic DFT and Test Resource Partitioning for 100 M Gate ASICs Part I : Current Chip-Level DFT Methology Overview

Bernd Könemann, .