T. Nishimura

An SOI-DRAM with wide operating voltage range by CMOS/SIMOX technology

T. Eimori, Y. Inoue, T. Iwamatsu, 1994, IEEE International Solid-State Circuits Conference.

Soft error susceptibility and immune structures in dynamic random access memories (DRAMs) investigated by nuclear microprobes

T. Kishimoto, S. Satoh, Yoshikazu Ohno, 1996 .