T. Dingle

发表

LIMA-a laser induced ion mass analyser

J. Ruckman, B. Griffiths, T. Dingle, 1981 .

An application of scanned focused ion beam milling to studies on the internal morphology of small arthropods

R. J. Young, P. Pugh, K. Robinson, 1993 .

XHR SEM: enabling extreme high resolution scanning electron microscopy

Richard Young, Sander Henstra, Jarda Chmelik, 2009, Scanning Microscopies.

Versatile Monochromator Module for XHR SEM

G. V. Veen, A. Henstra, T. Dingle, 2009, Microscopy and Microanalysis.

Extreme High-Resolution SEM: A Paradigm Shift

I. Gestmann, R. Young, L. Roussel, 2008, Microscopy Today.