Josef Kinseher

Failure mechanisms and test methods for the SRAM TVC write-assist technique

Ilia Polian, Josef Kinseher, Moritz Völker, 2016, 2016 21th IEEE European Test Symposium (ETS).

New Methods for Improving Embedded Memory Manufacturing Tests

Josef Kinseher, 2019 .

Improving Testability and Reliability of Advanced SRAM Architectures

Ilia Polian, Josef Kinseher, Moritz Voelker, 2019, IEEE Transactions on Emerging Topics in Computing.

Improving SRAM test quality by leveraging self-timed circuits

Ilia Polian, Andreas Leininger, Josef Kinseher, 2016, 2016 Design, Automation & Test in Europe Conference & Exhibition (DATE).

Analyzing the effects of peripheral circuit aging of embedded SRAM architectures

Ilia Polian, Leonhard Heis, Josef Kinseher, 2017, Design, Automation & Test in Europe Conference & Exhibition (DATE), 2017.

On the Automated Verification of User-defined MBIST Algorithms

Ilia Polian, Michael Richter, Josef Kinseher, 2015 .

Approximate simulation of circuits with probabilistic behavior

John P. Hayes, Alexandru Paler, Ilia Polian, 2013, 2013 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFTS).

On the Use of Assist Circuits for Improved Coupling Fault Detection in SRAMs

Ilia Polian, Josef Kinseher, Leonardo Bonet Zordan, 2015, 2015 IEEE 24th Asian Test Symposium (ATS).