Alekszej Romanenko

Disorder and cavity evolution in single-crystalline Ge during implantation of Sb ions monitored in-situ by spectroscopic ellipsometry

N. Khánh, T. Lohner, M. Fried, 2022, Materials Science in Semiconductor Processing.

In-Situ Control of Defect Dynamics By Ellipsometry During Ion Implantation – Evolution of Disorder and Cavity Structure in Single-Crystalline Ge During Implantation of Sb Ions

N. Khánh, T. Lohner, M. Fried, 2020 .

Concordant element of the oxidation kinetics—Interpretation of ellipsometric measurements on Zr

P. Petrik, E. Agócs, M. Serényi, 2021, Applied Surface Science.

In Situ Characterization of Biomaterials at Solid‐Liquid Interfaces Using Ellipsometry in the UV‐Visible‐NIR Wavelength Range

P. Petrik, E. Agócs, B. Kalas, 2019, physica status solidi (a).

Optical Properties of Oxidized, Hydrogenated, and Native Zirconium Surfaces for Wavelengths from 0.3 to 25 µm − A Study by Ex Situ and In Situ Spectroscopic Ellipsometry

S. Kurunczi, T. Lohner, P. Petrik, 2019, physica status solidi (a).

Analysis of structural and chemical inhomogeneity of thin films developed on ferrite grains by color etching with Beraha-I type etchant with spectroscopic ellipsometry and XPS

P. Petrik, A. Bonyár, P. Szabó, 2022, Journal of Materials Research and Technology.