I. Joachimsthaler

SEM/SThM-hybrid-system: a new tool for advanced thermal analysis of electronic devices

L. Balk, R. Heiderhoff, G. Zimmermann, 2002, Proceedings of the 9th International Symposium on the Physical and Failure Analysis of Integrated Circuits (Cat. No.02TH8614).

Electron-beam-induced potentials in semiconductors: calculation and measurement with an SEM/SPM hybrid system

Ludwig Josef Balk, Ralf Heiderhoff, L. Balk, 2004 .

A universal scanning-probe-microscope-based hybrid system

Ludwig Josef Balk, Ralf Heiderhoff, L. Balk, 2003 .

Near-field cathodoluminescence studies on n-doped gallium nitride films

Ludwig Josef Balk, Ralf Heiderhoff, Javier Piqueras, 2002 .