D. Souche

Correlation between microstructure and the optical properties of TiO2 thin films prepared on different substrates

V. N. Văn, Y. Leprince-Wang, J. Rivory, 1997 .

Relations between the optical properties and the microstructure of TiO2 thin films prepared by ion-assisted deposition

Y. Leprince-Wang, G. Vuye, S. Fisson, 2000 .

Initial stages in the formation of PtSi on Si(111) as followed by photoemission and spectroscopic ellipsometry

L. Ley, V. N. Văn, G. Vuye, 1995 .

Microstructural characterization of ion assisted SiO2 thin films by visible and infrared ellipsometry

V. N. Văn, G. Vuye, S. Fisson, 1998 .

Relationship between mixed TiO2-SiO2 films and TiO2/SiO2 interfaces. A combination of spectroscopic ellipsometry and photoemission spectroscopy

G. Vuye, S. Fisson, J. Rivory, 1997, Optical Interference Coatings.