Y.H. Chang

A Simple Method to Extract Source/Drain Series Resistance for Advanced MOSFETs

Y.H. Chang, Y.F. Wu, C.S. Ho, 2007, 2007 IEEE Conference on Electron Devices and Solid-State Circuits.

A new planar stacked technology (PST) for scaled and embedded DRAMs

Y.H. Chang, C.G. Hwang, U.I. Chung, 1996, International Electron Devices Meeting. Technical Digest.