Chris P. Kirk

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Design Of An Automated Optical Microscope For Measuring The Critical Dimensions Of Magnetic Recording Heads

Chris P. Kirk, 1987 .

Modeling The Optical Microscope Images Of Thick Layers For The Purpose Of Linewidth Measurement

Diana Nyyssonen, Chris P. Kirk, 1985, Advanced Lithography.

Theoretical Models For The Optical Alignment Of Wafer Steppers

Chris P. Kirk, C. P. Kirk, 1987, Advanced Lithography.

Modelling Optical Linewidth Measurement Techniques In Order To Improve Precision And Accuracy.

Chris P. Kirk, Andrew W. Gurnell, 1986, Optics & Photonics.

Analysis Of Linewidth Measurement Techniques For The Purpose Of Automation.

Chris P. Kirk, John C. C. Nelson, Derek S. Moore, 1984, Other Conferences.

A Study Of The Instrumental Errors In Linewidth And Registration Measurements Made With An Optical Microscope.

Chris P. Kirk, 1987, Advanced Lithography.

Development Of An Automated Image Shearing Microscope For Measuring The Critical Dimensions Of Magnetic Recording Heads.

Chris P. Kirk, Richard W. Gale, 1985, Optics & Photonics.

Analysis Of Linewidth Measurement Techniques For The Purpose Of Automation

Chris P. Kirk, Derek S. Moore, John C. C. Nelson, 1985 .