Chris Seguin

Maximizing ESD design window by optimizing gate bias for cascoded drivers in 45nm and beyond SOI technologies

Souvick Mitra, Junjun Li, Robert Gauthier, 2010, Electrical Overstress/Electrostatic Discharge Symposium Proceedings 2010.

Java object-sharing in Habanero

L. S. Jackson, Chris Seguin, Ed Grossman, 1998, CACM.

Identification and verification of BEOL metal fails due to ESD stress using current density analysis tool

Souvick Mitra, Robert Gauthier, Ralph Halbach, 2013, 2013 35th Electrical Overstress/Electrostatic Discharge Symposium.

A current density analysis tool to identify BEOL fails under ESD stress

Souvick Mitra, Robert Gauthier, Ralph Halbach, 2011, EOS/ESD Symposium Proceedings.