Takefumi Konishi

Observation of Atomic Defects on LiF(100) Surface with Ultrahigh Vacuum Atomic Force Microscope (UHV AFM)

M. Ohta, Y. Sugawara, Y. Enomoto, 1993 .

Effects of humidity and tip radius on the adhesive force measured with atomic force microscopy

M. Ohta, Y. Sugawara, Y. Enomoto, 1993 .

Difference between the forces measured by an optical lever deflection and by an optical interferometer in an atomic force microscope

Masahiro Ohta, Seizo Morita, Satoru Fujisawa, 1994 .