Y.-C. Huang
发表
Y.-C. Huang,
Y. Huang,
2003
.
AC stress and standard cell aging characterization to enhance reliability coverage of logic circuits
W. Wang,
Y.-H. Lee,
Y.-C. Huang,
2016,
2016 IEEE International Integrated Reliability Workshop (IIRW).
W. Wang,
Y.-H. Lee,
Y.-C. Huang,
2015,
2015 IEEE International Reliability Physics Symposium.
W. Wang,
Y.-H. Lee,
Y.-C. Huang,
2017,
2017 IEEE International Reliability Physics Symposium (IRPS).
W. Wang,
Y.-H. Lee,
Y.-C. Huang,
2015,
2015 IEEE International Reliability Physics Symposium.
Y.-C. Huang,
Y. Huang,
2003
.
Y.-C. Huang,
W.-L. Yeh,
J.-H. Chiou,
2013,
2013 35th Annual International Conference of the IEEE Engineering in Medicine and Biology Society (EMBC).
Chi-Bin Cheng,
Hsu-Shih Shih,
Y.-C. Huang,
2012,
J. Oper. Res. Soc..
C.-H. Wang,
Y.-C. Huang,
S.-C. Wu,
2014
.
C.-Y. Liu,
Y.-C. Huang,
S.-C. Lee,
1999
.
W. Wang,
Y.-H. Lee,
Y.-C. Huang,
2015,
2015 IEEE International Reliability Physics Symposium.
Shey-Shi Lu,
C.-C. Wu,
Y.-H. Chen,
2015,
VLSI Design, Automation and Test(VLSI-DAT).