L. Meng

Influence of the side-Ohmic contact processing on the polarization Coulomb field scattering in AlGaN/AlN/GaN heterostructure field-effect transistors

Zhaojun Lin, Hong Chen, Yingxia Yu, 2012 .

Extraction of AlGaN/GaN heterostructure Schottky diode barrier heights from forward current-voltage characteristics

T. Corrigan, Zhaojun Lin, Hong Chen, 2011 .

A simple method of extracting the polarization charge density in the AlGaN/GaN heterostructure from current-voltage and capacitance-voltage characteristics

Zhaojun Lin, Z. Wang, Yingxia Yu, 2012 .

Polarization Coulomb field scattering in AlGaN/AlN/GaN heterostructure field-effect transistors

Zhaojun Lin, Hong Chen, Zhifang Cao, 2011 .