A. Villanueva

Corrosion-induced degradation of GaAs PHEMTs under operation in high humidity conditions

Kenji Hosogi, Hajime Sasaki, Naohito Yoshida, 2009, Microelectron. Reliab..

Degradation Mechanism of AlGaAs/InGaAs Power Pseudomorphic High-Electron-Mobility Transistors under Large-Signal Operation

J. Alamo, H. Sasaki, K. Hayashi, 2008 .

Degradation Uniformity of RF-Power GaAs PHEMTs Under Electrical Stress

J. D. del Alamo, M. Somerville, T. Hisaka, 2008, IEEE Transactions on Device and Materials Reliability.

Electrical reliability of RF power GaAs PHEMTs

Anita A. Villanueva, A. Villanueva, 2003 .

Thermal, electrical and environmental reliability of InP HEMTs and GaAs PHEMTs

J.A. del Alamo, J. D. del Alamo, A.A. Villanueva, 2004, IEDM Technical Digest. IEEE International Electron Devices Meeting, 2004..

Electrical degradation mechanisms of RF power GaAs PHEMTs

Anita A. Villanueva, A. Villanueva, 2003, IEEE International Electron Devices Meeting 2003.