Y. Ma
发表
P. K. Tan,
Binghai Liu,
Z. Mai,
2017,
2017 IEEE 24th International Symposium on the Physical and Failure Analysis of Integrated Circuits (IPFA).
Pik Kee Tan,
Yuzhe Zhao,
Zhihong Mai,
2018,
Microelectron. Reliab..
L. Zhu,
Ran He,
Y. Z. Zhao,
2016,
Microelectron. Reliab..