Laung-Terng Wang

UltraScan: using time-division demultiplexing/multiplexing (TDDM/TDM) with VirtualScan for test cost reduction

Shianling Wu, Xiaoqing Wen, Boryau Sheu, 2005, IEEE International Conference on Test, 2005..

Luncheon Speaker: "Introduction to SoC testing".

Laung-Terng Wang, 2011, SOCC 2011.

VLSI Test Principles and Architectures

Xiaoqing Wen, Xiaoqing Wen, Laung-Terng Wang, 2006 .

Next Generation Test, Diagnostics and Yield Challenges for EDA, ATE, IP and Fab - A Perspective from All Sides

C. P. Ravikumar, Yervant Zorian, Laung-Terng Wang, 2007, 16th Asian Test Symposium (ATS 2007).

VirtualScan: a new compressed scan technology for test cost reduction

Shianling Wu, Hiroshi Furukawa, Xiaoqing Wen, 2004 .

Design for Testability

Xiaoqing Wen, Laung-Terng Wang, S Abdel-HafezKhader, 2006 .