Sebastian Badur

Characterization of Vegard strain related to exceptionally fast Cu-chemical diffusion in Cu[Formula: see text]Mo[Formula: see text]S[Formula: see text] by an advanced electrochemical strain microscopy method.

B. Roling, D. Dietzel, A. Schirmeisen, 2021, Scientific reports.

Characterization of Vegard strain related to exceptionally fast Cu-chemical diffusion in CuMoS by an advanced electrochemical strain microscopy method

B. Roling, D. Dietzel, A. Schirmeisen, 2021 .

Voltage- and Frequency-Based Separation of Nanoscale Electromechanical and Electrostatic Forces in Contact Resonance Force Microscopy: Implications for the Analysis of Battery Materials

B. Roling, A. Schirmeisen, D. Ebeling, 2020 .