J.H. Orchard-Webb

A new structure for measuring the thermal conductivity of integrated circuit dielectrics

J.H. Orchard-Webb, 1990, Proceedings of the 1991 International Conference on Microelectronic Test Structures.

The use of test structures to identify leakage failure mechanisms in CMOS inputs

J.H. Orchard-Webb, 1993, ICMTS 93 Proceedings of the 1993 International Conference on Microelectronic Test Structures.

A simple test structure for measuring substrate resistivity

J.H. Orchard-Webb, R. Cloutier, 1989, Proceedings of the 1989 International Conference on Microelectronic Test Structures.