Jungjae Park

发表

Active autofocus control using source dithering technique based on fibre-optic confocal principle

Seung-Woo Kim, Jungjae Park, Seung-Woo Kim, 2011 .

Continuous scanning phase measurement for high immunity to vibration

Seung-Woo Kim, Jungjae Park, Joonho You, 2009, Optical Engineering + Applications.

A point-diffraction interferometer with vibration-desensitizing capability

Seung-Woo Kim, Hagyong Kihm, Jungjae Park, 2006, SPIE Optics + Photonics.

Simultaneous measurement of the thickness profile and refractive index distribution of silicon wafers

Jae Wan Kim, Jungjae Park, Chu-Shik Kang, 2013, Defense, Security, and Sensing.

Point-diffraction fiber interferometer for vibration desensitization

Seung-Woo Kim, Hagyong Kihm, Jungjae Park, 2005, SPIE Optical Metrology.

Precise thickness measurement and comparison of step-shaped microfluidic channel mold using optical interferometry

Jungjae Park, Jonghan Jin, Jaeseok Bae, 2019, Optical Metrology.

Dimensional metrology on a semiconductor packaging process using an optical comb

Jungjae Park, Jonghan Jin, Saerom Maeng, 2014, Sensing Technologies + Applications.

Uncertainty evaluation of the geometrical thickness and refractive index of silicon wafers

Jae Wan Kim, Jungjae Park, Chu-Shik Kang, 2013, Defense, Security, and Sensing.

Sub-100-nm precision distance measurement by means of all-fiber photonic microwave mixing.

Yoon-Soo Jang, Jungjae Park, Jonghan Jin, 2021, Optics express.

Uncertainty improvement of geometrical thickness and refractive index measurement of a silicon wafer using a femtosecond pulse laser.

Jungjae Park, Jonghan Jin, Saerom Maeng, 2012, Optics express.

Modified Roberts-Langenbeck test for measuring thickness and refractive index variation of silicon wafers.

Lingfeng Chen, Ulf Griesmann, Jungjae Park, 2012, Optics express.

Total physical thickness measurement of a multi-layered wafer using a spectral-domain interferometer with an optical comb.

Jungjae Park, Jonghan Jin, Jaeseok Bae, 2017, Optics express.