Vladimir Mancevski

Development of a dual-probe Caliper CD-AFM for near model-independent nanometrology

Vladimir Mancevski, Paul F. McClure, 2002, SPIE Advanced Lithography.

Conductive carbon nanotubes for semiconductor metrology

Vladimir Mancevski, Victor Vartanian, Paul McClure, 2010, NanoScience + Engineering.

Calibration of a dual probe NanoCaliper AFM for CD metrology

Vladimir Mancevski, Paul F. McClure, Paul F. Mcclure, 2005, SPIE Advanced Lithography.

Single-crystal silicon triple-torsional micro-oscillators for use in magnetic resonance force microscopy

Vladimir Mancevski, Troy C. Messina, John T. Markert, 2001, SPIE MOEMS-MEMS.