Kouji Kondou

发表

Cluster SIMS using metal cluster complex ions

H. Itoh, H. Nonaka, S. Ichimura, 2008 .

Characteristics of a cluster‐ion beam of Os3(CO)n+ (n = 7 or 8) for low‐damage sputtering

H. Nonaka, S. Ichimura, A. Kurokawa, 2006 .

Factorial analysis of cluster-SIMS depth profiling using metal-cluster-complex ion beams

H. Nonaka, S. Ichimura, A. Kurokawa, 2008 .

Depth resolution improvement in secondary ion mass spectrometry analysis using metal cluster complex ion bombardment

M. Koike, H. Nonaka, S. Ichimura, 2006 .

Production and Applications of Metal-cluster-complex Ion Beams

H. Itoh, H. Nonaka, S. Ichimura, 2009 .

Irradiation characteristics of metal-cluster-complex ions containing diverse multi-elements with large mass differences

H. Nonaka, S. Ichimura, A. Kurokawa, 2007 .

Secondary-Ion-Mass-Spectrometry Depth Profiling of Ultra-shallow Boron Delta Layers in Silicon with Massive Molecular Ion Beam of Ir4(CO)7+

H. Nonaka, S. Ichimura, A. Kurokawa, 2007 .

SIMS depth profile study using metal cluster complex ion bombardment

M. Koike, H. Nonaka, S. Ichimura, 2007 .

Secondary Ion Mass Spectrometry of Organic Thin Films Using Metal-Cluster-Complex Ion Source

H. Itoh, H. Nonaka, S. Ichimura, 2006 .

Ion-beam characteristics of the metal cluster complex of Ir4(CO)12

H. Nonaka, S. Ichimura, A. Kurokawa, 2006 .

Production of Stable Ion Beam of Os3(CO)12 with Compact Metal-Cluster-Complex Ion Source

H. Nonaka, S. Ichimura, A. Kurokawa, 2006 .

Beam-induced Nanoscale Ripple Formation on Silicon with the Metal-Cluster-Complex Ion of Ir4(CO)7+

H. Itoh, H. Nonaka, S. Ichimura, 2007 .

Observation of a Si surface sputtered by an ion irradiation system using a prototype compact cluster ion source

H. Nonaka, S. Ichimura, T. Fujimoto, 2007 .

HOPG surface irradiated by metal cluster complex ions

M. Ishizuka, H. Nonaka, A. Kushino, 2008 .

Sputtered Si surface irradiated by metal cluster complex ions such as Os3(CO)12 and Ir4(CO)12

H. Nonaka, S. Ichimura, T. Fujimoto, 2007 .