Farid Matta

Demountable TAB: improving manufacturability of TAB

B. Afshari, B. Heflinger, Farid Matta, 1991, [1991 Proceedings] Eleventh IEEE/CHMT International Electronics Manufacturing Technology Symposium.

Reliability of area array pressure contacts on the DTAB package

Kenneth D. Scholz, Farid Matta, Rajendra D. Pendse, 1993 .

Membrane probe card technology (the future for higher performance wafer test)

Farid Matta, Brian Leslie, B. Leslie, 1988, International Test Conference 1988 Proceeding@m_New Frontiers in Testing.

THE FUTURE FOR HIGH PERFORMANCE WAFER TEST)

Farid Matta, Brian Leslie, 1988 .

Automatic compensating device and self-leveling film probe device

Farid Matta, Richard E. Huff, 1989 .

Demountable TAB-a new path for TAB technology

B. Heflinger, Farid Matta, Rajendra D. Pendse, 1994 .