Samuel Dambreville

发表

Yogesh Rathi, Allen R. Tannenbaum, Samuel Dambreville, 2006, CVAMIA.

Allen R. Tannenbaum, Shawn Lankton, Samuel Dambreville, 2009, Proceedings of the 48h IEEE Conference on Decision and Control (CDC) held jointly with 2009 28th Chinese Control Conference.

Anthony J. Yezzi, Allen R. Tannenbaum, Shawn Lankton, 2008, 2008 15th IEEE International Conference on Image Processing.

Yogesh Rathi, Allen R. Tannenbaum, Samuel Dambreville, 2006, ICIAR.

Anthony Yezzi, Samuel Dambreville, Allen Tannenbaum, 2009, CVPR.

Scot Shaw, Shawn Lankton, Allen Tannenbaum, 2011, Proceedings of the 2011 American Control Conference.

Yogesh Rathi, Allen R. Tannenbaum, Samuel Dambreville, 2006, 2006 IEEE Computer Society Conference on Computer Vision and Pattern Recognition (CVPR'06).

Anthony J. Yezzi, Allen R. Tannenbaum, Samuel Dambreville, 2011, IEEE Transactions on Pattern Analysis and Machine Intelligence.

Yogesh Rathi, Allen R. Tannenbaum, Samuel Dambreville, 2006, ICIAR.

Anthony J. Yezzi, Allen R. Tannenbaum, Samuel Dambreville, 2008, ECCV.

Yogesh Rathi, Allen Tannenbaum, Samuel Dambreville, 2006, Electronic Imaging.

James G. Malcolm, Allen R. Tannenbaum, Shawn Lankton, 2008, 2008 IEEE Computer Society Conference on Computer Vision and Pattern Recognition Workshops.

Anthony J. Yezzi, Marc Niethammer, Allen R. Tannenbaum, 2007, BMVC.

James J. Levitt, Martha Elizabeth Shenton, Marc Niethammer, 2008, SPIE Medical Imaging.

Allen R. Tannenbaum, Samuel Dambreville, Romeil Sandhu, 2010, IEEE Transactions on Pattern Analysis and Machine Intelligence.

Allen Tannenbaum, Yogesh Rathi, Samuel Dambreville, 2006, Electronic Imaging.

Anthony J. Yezzi, Allen R. Tannenbaum, Samuel Dambreville, 2010, SIAM J. Imaging Sci..

Anthony J. Yezzi, Marc Niethammer, Allen R. Tannenbaum, 2007, SIP.

Anthony J. Yezzi, Allen R. Tannenbaum, Samuel Dambreville, 2009, 2009 IEEE Conference on Computer Vision and Pattern Recognition.

Allen R. Tannenbaum, Samuel Dambreville, Romeil Sandhu, 2008, 2008 IEEE Conference on Computer Vision and Pattern Recognition.

Yogesh Rathi, Allen R. Tannenbaum, Samuel Dambreville, 2008, IEEE Transactions on Pattern Analysis and Machine Intelligence.