Y.W. Chang

A New Interference Phenomenon in Sub-60nm Nitride-Based Flash Memory

C.H. Chen, T.C. Lu, W.P. Lu, 2007, 2007 22nd IEEE Non-Volatile Semiconductor Memory Workshop.

A novel CBCM method free from charge injection induced errors: investigation into the impact of floating dummy-fills on interconnect capacitance

T.C. Lu, Y.W. Chang, C.Y. Lu, 2005, Proceedings of the 2005 International Conference on Microelectronic Test Structures, 2005. ICMTS 2005..

The Impact of Interference on Multi-Level-Cell Applications in Scaled Nitride-Storage Flash Memory

T.C. Lu, Y.W. Chang, I.C. Yang, 2008, 2008 Joint Non-Volatile Semiconductor Memory Workshop and International Conference on Memory Technology and Design.

Analysis of Electron and Hole Distributions on Scaled NBit Flash Cells

T.C. Lu, Y.W. Chang, I.C. Yang, 2006, 2006 International Symposium on VLSI Technology, Systems, and Applications.

Characterization and Monte Carlo Analysis of Secondary Electrons Induced Program Disturb in a Buried Diffusion Bit-line SONOS Flash Memory

Chih-Yuan Lu, T.C. Lu, Y.W. Chang, 2007, 2007 IEEE International Electron Devices Meeting.