Jing Zhuge

发表

Design Optimization for Digital Circuits Built With Gate-All-Around Silicon Nanowire Transistors

Ru Huang, Yangyuan Wang, Runsheng Wang, 2012, IEEE Transactions on Electron Devices.

Characterization and analysis of gate-all-around Si nanowire transistors for extreme scaling

Tao Yu, Huailin Liao, Xin Huang, 2011, 2011 IEEE Custom Integrated Circuits Conference (CICC).

HCI and NBTI induced degradation in gate-all-around silicon nanowire transistors

Liangliang Zhang, Yangyuan Wang, Runsheng Wang, 2011, Microelectron. Reliab..

Experimental Investigations on Carrier Transport in Si Nanowire Transistors: Ballistic Efficiency and Apparent Mobility

Xing Zhang, Ru Huang, Donggun Park, 2008, IEEE Transactions on Electron Devices.

Experimental study on quasi-ballistic transport in silicon nanowire transistors and the impact of self-heating effects

Ru Huang, Donggun Park, Runsheng Wang, 2008, 2008 IEEE International Electron Devices Meeting.

Investigation of Low-Frequency Noise in Silicon Nanowire MOSFETs

Ru Huang, Yu Tian, Donggun Park, 2009, IEEE Electron Device Letters.

New observations of suppressed randomization in LER/LWR of Si nanowire transistors: Experiments and mechanism analysis

Ru Huang, Runsheng Wang, Yangyuan Wang, 2010, 2010 International Electron Devices Meeting.

Experimental investigation and design optimization guidelines of characteristic variability in silicon nanowire CMOS technology

Ru Huang, Xing Zhang, Xin Huang, 2009, 2009 IEEE International Electron Devices Meeting (IEDM).

Investigation on Variability in Metal-Gate Si Nanowire MOSFETs: Analysis of Variation Sources and Experimental Characterization

Ru Huang, Donggun Park, Runsheng Wang, 2011, IEEE Transactions on Electron Devices.

Investigation of Nanowire Line-Edge Roughness in Gate-All-Around Silicon Nanowire MOSFETs

Ru Huang, Runsheng Wang, Yangyuan Wang, 2010, IEEE Transactions on Electron Devices.

High-Performance BOI FinFETs Based on Bulk-Silicon Substrate

Ru Huang, Xing Zhang, Runsheng Wang, 2008, IEEE Transactions on Electron Devices.

Experimental Demonstration of Current Mirrors Based on Silicon Nanowire Transistors for Inversion and Subthreshold Operations

Ru Huang, Runsheng Wang, Yangyuan Wang, 2011, IEEE Transactions on Electron Devices.

New insights into oxide traps characterization in gate-all-around nanowire transistors with TiN metal gates based on combined Ig-Id RTS technique

Ru Huang, Donggun Park, Runsheng Wang, 2006, 2009 Symposium on VLSI Technology.

New insights into oxide traps characterization in gate-all-around nanowire transistors with TiN metal gates based on combined I g -I d RTS technique

Ru Huang, Donggun Park, Runsheng Wang, 2006, VLSIT 2006.

Analog/RF Performance of Si Nanowire MOSFETs and the Impact of Process Variation

Ru Huang, Xing Zhang, Yu Tian, 2007, IEEE Transactions on Electron Devices.

Investigation on Self-Heating Effect in Gate-All-Around Silicon Nanowire MOSFETs From Top-Down Approach

Ru Huang, Donggun Park, Runsheng Wang, 2009, IEEE Electron Device Letters.

High-Performance Si Nanowire Transistors on Fully Si Bulk Substrate From Top-Down Approach: Simulation and Fabrication

Ru Huang, Xing Zhang, Yu Tian, 2010, IEEE Transactions on Nanotechnology.

Digital-circuit analysis of short-gate tunnel FETs for low-voltage applications

Ru Huang, Wim Dehaene, Guido Groeseneken, 2011 .

Impacts of non-negligible electron trapping/detrapping on the NBTI characteristics in silicon nanowire transistors with TiN metal gates

Ru Huang, Donggun Park, Runsheng Wang, 2008, 2008 IEEE International Electron Devices Meeting.

Investigation of Parasitic Effects and Design Optimization in Silicon Nanowire MOSFETs for RF Applications

Ru Huang, Xing Zhang, Runsheng Wang, 2008, IEEE Transactions on Electron Devices.

New Self-Aligned Silicon Nanowire Transistors on Bulk Substrate Fabricated by Epi-Free Compatible CMOS Technology: Process Integration, Experimental Characterization of Carrier Transport and Low Frequency noise

Ru Huang, Xing Zhang, Yu Tian, 2007, 2007 IEEE International Electron Devices Meeting.