G. Yoon

Characteristics of hetero‐structured thermoelectric devices with a ‐ Si / Mg 2 Si‐stacked thin film layers

C. Yoon, B. Jeon, J. Lee, 2018, Electronics Letters.

Three-dimensional imaging of carbon clusters in thermally stable nickel silicides by carbon pre-implantation

J. Seol, Jeong-Soo Lee, I.-A. Park, 2021 .

Impact of geometrical parameters on the electrical performance of network-channel polycrystalline silicon thin-film transistors

Jeong-Soo Lee, R. Baek, Bo Jin, 2018, Japanese Journal of Applied Physics.

Temperature-induced Instability of Retention Characteristics in 3-D NAND Flash Memory

Jeong-Soo Lee, G. Yoon, Ukju An, 2023, IEEE Electron Devices Technology and Manufacturing Conference.

Extraction of Nitride Trap Profile in 3-D NAND Flash Memory Using Intercell Program Pattern

Jeong-Soo Lee, Jungsik Kim, Jounghun Park, 2021, IEEE Access.

Fabrication and Characterization of Nanonet-Channel LTPS TFTs Using a Nanosphere-Assisted Patterning Technique

Jeong-Soo Lee, Donghoon Kim, Bo Jin, 2021, Micromachines.

Impact of P/E Stress on Trap Profiles in Bandgap-engineered Tunneling Oxide of 3D NAND Flash Memory

Jeong-Soo Lee, Jungsik Kim, D. Go, 2022, IEEE Access.

Novel Dummy Cell Programming Scheme to Improve Retention Characteristics in 3-D NAND Flash Memory

G. Yoon, Donghwi Kim, Donghyun Go, 2024, IEEE Transactions on Electron Devices.

Effects of Poly-Si Grain Boundary on Retention Characteristics under Cross-Temperature Conditions in 3-D NAND Flash Memory

G. Yoon, Ukju An, Donghwi Kim, 2023, Micromachines.