M. Eloker

Corrigendum: Multilayer film thickness measurement using ultrafast terahertz pulsed imaging (2019 J. Phys. Commun. 3 035013)

S. Khalil, H. Sherif, Dahi Ghareab Abdelsalam Ibrahim, 2019, Journal of Physics Communications.

Radius of curvature measurement of spherical smooth surfaces by multiple-beam interferometry in reflection

Daesuk Kim, D. Abdelsalam, M. Shaalan, 2010 .

Surface microtopography measurement of a standard flat surface by multiple-beam interference fringes at reflection

D. Abdelsalam, M. Shaalan, M. Eloker, 2010 .

Multilayer film thickness measurement using ultrafast terahertz pulsed imaging

S. Khalil, H. Sherif, Dahi Ghareab Abdelsalam Ibrahim, 2019, Journal of Physics Communications.

Nanostructure iron-silicon thin film deposition using plasma focus device

M. Kotb, A. H. Saudy, M. Eloker, 2013 .