T. Petersen

What Do You Get If You Cross a Phase Object Approximation with a Dynamically Scattering Sample?

P. Nellist, S. Findlay, C. O’Leary, 2020, Microscopy and Microanalysis.

Exploring the Validity Limits of Direct Ptychographic Methods to Analyse 4D Scanning Transmission Electron Microscopy Datasets

H. Yang, L. Clark, E. Liberti, 2022, Microscopy and Microanalysis.

Volume Imaging By Tracking Sparse Topological Features In Electron Micrograph Tilt Series

J. Etheridge, C. Zhao, E. Bøjesen, 2022, Microscopy and Microanalysis.

Hybrid Reverse Monte Carlo and electron phase contrast image simulations of amorphous silicon with and without paracrystals

S. Russo, T. Petersen, A. Liu, 2016 .

Statistical measures of angular correlations in amorphous materials from electron nano-diffraction in the scanning/transmission electron microscope

A. V. Martin, M. Weyland, E. Bøjesen, 2020, Journal of Physics: Materials.

Probing local order in glasses from limited-volume electron and x-ray diffraction

M. D. de Jonge, L. Bourgeois, R. Tabor, 2016 .

Factors limiting quantitative phase retrieval in atomic-resolution differential phase contrast scanning transmission electron microscopy using a segmented detector.

M. Weyland, D. Paganin, R. Ishikawa, 2021, Ultramicroscopy.

Adventures in 4D-STEM - Underpinned by the Legacy of JCH Spence

C. Zheng, W. Li, T. Petersen, 2022, Microscopy and Microanalysis.

Electron Singularities, Matter Wave Catastrophes, and Vortex Lattice Singularimetry

M. Weyland, D. Paganin, A. Bishop, 2015, Microscopy and Microanalysis.

Resolution of Virtual Depth Sectioning from Four-Dimensional Scanning Transmission Electron Microscopy.

C. Ophus, S. Findlay, H. Brown, 2023, Microscopy and microanalysis : the official journal of Microscopy Society of America, Microbeam Analysis Society, Microscopical Society of Canada.