S. Deniau

Critical radius of holes in liquid coating

C. Sykes, Véronique Détappe, C. Andrieu, 1994 .

Real time control of plasma deposited multilayers by multiwavelength ellipsometry

M. Kildemo, B. Drévillon, P. Bulkin, 1996 .

Real time control of the growth of silicon alloy multilayers by multiwavelength ellipsometry

M. Kildemo, B. Drévillon, P. Bulkin, 1996 .

Real-time monitoring by multiwavelength ellipsometry of the growth of silicon alloy multilayers and gradient index structures

Bernard Drevillon, Pavel Bulkin, Morten Kildemo, 1996, Optical Systems Design.