F. Burkeen

Detection, binning, and analysis of defects in a GaN-on-Si process for High Brightness Light Emitting Diode's

B. Dutta, A. Mani, H. Osman, 2012, 2012 SEMI Advanced Semiconductor Manufacturing Conference.

Comparison between Measurement Techniques Used for Determination of the Micropipe Density in SiC Substrates

A. Weber, M. Dudley, J. Oliver, 2006 .