U. Kall

Influence of the measurement parameters on the reliability of ferroelectric thin films

R. Waser, S. Tiedke, M. Kastner, 2001 .

Electrical measurements on capacitor sizes in the submicron regime for the characterization of real memory cell capacitors

R. Waser, S. Tiedke, M. Grossmann, 2001 .

Direct hysteresis measurements of single nanosized ferroelectric capacitors contacted with an atomic force microscope

Rainer Waser, Ramamoorthy Ramesh, S. Tiedke, 2001 .