Ryota Kudo

发表

FUNDAMENTAL VERIFICATION FOR 2-DIMENSIONAL SUPER- RESOLUTION OPTICAL INSPECTION FOR SEMICONDUCTOR DEFECTS BY USING STANDING WAVE ILLUMINATION SHIFT

Satoru Takahashi, Kiyoshi Takamasu, Ryota Kudo, 2009 .

Multiple image reconstruction for high-resolution optical imaging using structured illumination

Satoru Takahashi, Kiyoshi Takamasu, Ryota Kudo, 2010, Optical Engineering + Applications.

1P2a-6 Optical observation of Lamb Wave in Metal Plate Having a Stepped Thickness(Poster Session)

Kazuhiko Imano, Ryota Kudo, 2008 .

Systematic error analysis for 3D nanoprofiler tracing normal vector

Ryota Kudo, Motohiro Nakano, Katsuyoshi Endo, 2015, SPIE Optifab.

The measurement of an aspherical mirror by three-dimensional nanoprofiler

Ryota Kudo, Motohiro Nakano, Katsuyoshi Endo, 2015, SPIE Optical Systems Design.

High-accuracy three-dimensional aspheric mirror measurement with nanoprofiler based on normal vector tracing method

Ryota Kudo, Motohiro Nakano, Katsuyoshi Endo, 2017 .

A new optical head tracing reflected light for nanoprofiler

Ryota Kudo, Motohiro Nakano, Kazuya Yamamura, 2014, Optics & Photonics - Optical Engineering + Applications.

Simulation-Based Analysis of Influence of Error on Super-Resolution Optical Inspection

Satoru Takahashi, Kiyoshi Takamasu, Ryota Kudo, 2011, Int. J. Autom. Technol..

Algorithm for 2-Dimensional Super-Resolution Optical Inspection for Semiconductor Defects by Using Standing Wave Illumination

Satoru Takahashi, Kiyoshi Takamasu, Ryota Kudo, 2009 .

Simulation-based systematic error compensation for nanoprofiler using normal vector tracing method

Ryota Kudo, Motohiro Nakano, Katsuyoshi Endo, 2015 .