Yufei Gao

Structure and composition of grain boundary dislocation cores and stacking faults in MOCVD-grown YBa2Cu3O7−x thin films

G. Bai, D. Lam, K. Merkle, 1991 .

A TEM-EELS study of hole concentrations near strongly and weakly coupled grain boundaries in electromagnetically characterized YBa2Cu3O7−δ bicrystals

D. Larbalestier, S. Babcock, D. Kaiser, 1994 .