J. A. Zoutendyk

Empirical Modeling of Single-Event Upset (SEU) in NMOS Depletion-Mode-Load Static RAM (SRAM) Chips

S. L. Smith, J. A. Zoutendyk, L. S. Smith, 1986, IEEE Transactions on Nuclear Science.

Single-Event Upset (SEU) in a Dram with On-Chip Error Correction

H. R. Schwartz, J. A. Zoutendyk, R. K. Watson, 1987, IEEE Transactions on Nuclear Science.

SINGLE-EVENT UPSET(SEU)INA DRAMWITHON-CHIPERRORCORRECTION

H. R. Schwartz, J. A. Zoutendyk, K. Watson, 1987 .

Experimental Evidence for a New Single-Event Upset (SEU) Mode in a CMOS SRAM Obtained from Model Verification

J. A. Zoutendyk, L. S. Smith, G. A. Soli, 1987, IEEE Transactions on Nuclear Science.

CMOS-ASIC life-predictions from test-coupon data

Martin G. Buehler, J. A. Zoutendyk, N. Zamani, 1992, ICMTS 92 Proceedings of the 1992 International Conference on Microelectronic Test Structures.