Eugene R. Worley

Effects of plasma-etching-induced gate oxide degradation on MOSFET's 1/f noise

Chun Hu, Scott T. Martin, Eugene R. Worley, 1994, Advanced Lithography.

Optimization of input protection diode for high speed applications

Eugene R. Worley, Alex Bakulin, 2002, 2002 Electrical Overstress/Electrostatic Discharge Symposium.

Consideration f Low-Fre uency Noise in MOSFE 's for Analog Performance

Eugene R. Worley, G. P. Li, E. Worley, 1996 .