T. Kondo
发表
The investigation of the electrical contact resistance through thin oxide layer on a nanometer scale
K. Mori,
S. Kawabata,
T. Yudate,
2016,
2016 IEEE 62nd Holm Conference on Electrical Contacts (Holm).
Tetsuo Shimizu,
N. Watanabe,
K. Mori,
2015,
2015 IEEE 61st Holm Conference on Electrical Contacts (Holm).
J. Miyawaki,
Tetsuo Shimizu,
S. Fujii,
2014,
2014 IEEE 60th Holm Conference on Electrical Contacts (Holm).
T. Tamagawa,
T. Nishimura,
T. Shimada,
2017,
2017 IEEE Holm Conference on Electrical Contacts.
Yasuhiro Fukuyama,
Nobu-hisa Kaneko,
Norihiko Sakamoto,
2017,
IEEE Transactions on Instrumentation and Measurement.
N. Kaneko,
Y. Fukuyama,
Norihiko Sakamoto,
2018,
IEEE Transactions on Components, Packaging and Manufacturing Technology.
N. Kaneko,
Y. Fukuyama,
Norihiko Sakamoto,
2015,
2015 IEEE 61st Holm Conference on Electrical Contacts (Holm).
K. Miyake,
A. Omura,
M. Fukuta,
2014,
2014 IEEE 60th Holm Conference on Electrical Contacts (Holm).
Y. Kubota,
K. Hayakawa,
Tamotsu Nakamura,
2014,
2014 IEEE 60th Holm Conference on Electrical Contacts (Holm).