D. N. Nguyen

Investigation of the Mechanism of Stuck Bits in High Capacity SDRAMs

L. Scheick, S. Guertin, D. N. Nguyen, 2008, 2008 IEEE Radiation Effects Data Workshop.

The single hard error mechanisms and response in SDRAMs

L. Scheick, S. Guertin, D. N. Nguyen, 2003 .

Endurance cycling results in extreme environments

D. N. Nguyen, L. Z. Scheick, S. M. Guertin, 2003 .