Yujeong Seo

Hydrogen passivation effects under negative bias temperature instability stress in metal/silicon-oxide/silicon-nitride/silicon-oxide/silicon capacitors for flash memories

Tae Geun Kim, Hee-Dong Kim, Yongjie Zhang, 2010, Microelectron. Reliab..

Countermeasure of Sniffing Attack : Survey

Sunghyuck Hong, Yujeong Seo, 2016 .

Comparative investigation of endurance and bias temperature instability characteristics in metal-Al 2 O 3 - nitride-oxide-semiconductor (MANOS) and semiconductor-oxide-nitride-oxide-semiconductor (SONOS) charge trap flash memory

Tae Geun Kim, Il Hwan Cho, Sungwook Park, 2012 .