S. Rizwan

Impact of Short-Wavelength and Long-Wavelength Line-Edge Roughness on the Variability of Ultrascaled FinFETs

T. Hook, M. Vaidyanathan, K. Holland, 2017, IEEE Transactions on Electron Devices.

Switching-Speed Limitations of Ferroelectric Negative-Capacitance FETs

Terence B. Hook, Prasad S. Gudem, Shahriar Rizwan, 2016, IEEE Transactions on Electron Devices.

Impact of Contact Resistance on the $f_T$ and $f_{\max}$ of Graphene Versus $\text{MoS}_2$ Transistors

M. Vaidyanathan, K. Holland, N. Paydavosi, 2017, IEEE Transactions on Nanotechnology.

Impact of Contact Resistance on the fT and f max of Graphene Versus MoS 2 Transistors

M. Vaidyanathan, K. Holland, N. Paydavosi, 2016 .

A multi-step approach for RSSi-based distance estimation using smartphones

M. M. Rahman, T. I. Chowdhury, Sadre-Ala Parvez, 2015, 2015 International Conference on Networking Systems and Security (NSysS).