Vijay Reddy
发表
Bo Yang,
Yu Cao,
Wenping Wang,
2008,
2008 IEEE Custom Integrated Circuits Conference.
Mehrdad Nourani,
Senthil Arasu,
John M. Carulli,
2014,
Fifteenth International Symposium on Quality Electronic Design.
Charvaka Duvvury,
Robert Steinhoff,
Gianluca Boselli,
2004,
2004 Electrical Overstress/Electrostatic Discharge Symposium.
John M. Carulli,
Vijay Reddy,
Anand T. Krishnan,
2004,
2004 International Conferce on Test.
Srikanth Krishnan,
Andrew Marshall,
Sreedhar Natarajan,
2005,
Microelectron. Reliab..
Vijay Reddy,
Ying-Ying Hsieh,
Jeff Mendoza,
2016
.
Min Chen,
Haldun Kufluoglu,
Vijay Reddy,
2014,
JETC.
Yu Cao,
Srikanth Krishnan,
Rui Zheng,
2009,
2009 IEEE Custom Integrated Circuits Conference.
Yiyu Shi,
Sheldon X.-D. Tan,
Wenping Wang,
2012
.
Chris H. Kim,
Bongjin Kim,
Minsu Kim,
2018,
2018 IEEE International Reliability Physics Symposium (IRPS).
Yu Cao,
Wenping Wang,
Srikanth Krishnan,
2007,
2007 IEEE Custom Integrated Circuits Conference.
Min Chen,
Yu Cao,
Srikanth Krishnan,
2013,
2013 Proceedings of the European Solid-State Device Research Conference (ESSDERC).
Min Chen,
Mehrdad Nourani,
Senthil Arasu,
2014,
JETC.
Min Chen,
Yu Cao,
Srikanth Krishnan,
2012,
IEEE Design & Test of Computers.
Kenneth M. Butler,
Mehrdad Nourani,
Senthil Arasu,
2013,
2013 IEEE International Test Conference (ITC).
Mehrdad Nourani,
Senthil Arasu,
John M. Carulli,
2013,
International Symposium on Quality Electronic Design (ISQED).