H. Hantsche

发表

Vertical differential charging in monochromatized small spot X‐ray photoelectron spectroscopy

Xiang-Rong Yu, H. Hantsche, 1993 .

Comparison of basic principles of the surface‐specific analytical methods: AES/SAM, ESCA (XPS), SIMS, and ISS with X‐ray microanalysis, and some applications in research and industry

H. Hantsche, 1989 .

GeV heavy ion induced adhesion enhancement

C. Trautmann, J. Vetter, D. Rück, 1993 .

High resolution XPS of organic polymers, the scienta ESCA300 database. By G. Beamson and D. Briggs, Wiley, Chichester 1992, 295 pp., hardcover, £ 65.00, ISBN 0‐471‐93592‐1

H. Hantsche, 1993 .

High resolution XPS of organic polymers. The scienta database

H. Hantsche, 1993 .

Further development of microarea analysis techniques for determining nitrogen in steels

W. Rehbach, P. Karduck, P. Schwaab, 1987 .

Characterization of Ta2O5 layers by electron spectroscopy for chemical analysis rutherford backscattering spectrometry, nuclear reaction analysis and optical methods

F. Rauch, K. Bange, K. Bange, 1989 .

A simple beam current stabilizing unit for SEMs

H. Hantsche, J. Arndt, D. Schmidt, 1978 .

Some aspects of the charging effect in monochromatized focused XPS

H. Hantsche, X. Yu, 1993 .

Optical absorption of amorphous WO3 and binding state of tungsten

Klaus Bange, A. Temmink, K. Bange, 1990 .

High spatial resolution auger electron spectroscopy and x-ray photoelectron spectroscopy

H. Hantsche, 1989 .

4f level shifts of tungsten and colouration state of a-WO3

K. Bange, O. Anderson, A. Temmink, 1990 .

Pressure dependence of the charging effect in monochromatized small spot X-ray photoelectron spectroscopy

Xiang-Rong Yu, H. Hantsche, 1990 .