J. L. Wert

First record of single event upset on the ground, Cray-1 computer memory at Los Alamos in 1976

Gary Grider, Sarah E. Michalak, Steve Johnson, 2010 .

Compendium of single event failures in power MOSFETs

G. M. Swift, J. L. Wert, J. R. Coss, 1998, 1998 IEEE Radiation Effects Data Workshop. NSREC 98. Workshop Record. Held in conjunction with IEEE Nuclear and Space Radiation Effects Conference (Cat. No.98TH8385).

Observations of single event failure in power MOSFETs

R. Koga, J. L. Wert, D. K. Nichols, 1994, Workshop Record. 1994 IEEE Radiation Effects Data Workshop.

Single event upset and latchup measurements in avionics devices using the WNR neutron beam and a new neutron-induced latchup model

Stephen A. Wender, J. L. Wert, A. Gavron, 1995, Proceedings of 1995 IEEE Nuclear and Space Radiation Effects Conference (NSREC'95).

Team Update on North American Proton Facilities for Radiation Testing

Steven M. Guertin, Scott Davis, Kenneth A. LaBel, 2016 .

Update of single event failure in power MOSFETs

T. F. Miyahira, J. L. Wert, D. K. Nichols, 1996, 1996 IEEE Radiation Effects Data Workshop. Workshop Record. Held in conjunction with The IEEE Nuclear and Space Radiation Effects Conference.

Comparison and implications of charge collection measurements in silicon and InGaAs irradiated by energetic protons and neutrons

E. Normand, Stephen A. Wender, J. L. Wert, 1995 .