T. Asai

发表

Improvement of field induced oxygen etching method preparing a gas filed ion emitter with ideal shape at the atomic level

K. Kajiwara, K. Hata, T. Iwata, 2012, 25th International Vacuum Nanoelectronics Conference.

Stability measurement of neon ion beam current emitted from supertip gas field ion source

K. Kajiwara, K. Hata, T. Iwata, 2012, 25th International Vacuum Nanoelectronics Conference.