J. Jormanainen
发表
S. Wirths,
E. Bianda,
E. Mengotti,
2020
.
M. Paulasto-Kröckel,
V. Vuorinen,
G. Ross,
2021,
Microelectronics Reliability.
V. Vuorinen,
N. Kaminski,
M. Hanf,
2022,
Microelectronics Reliability.
C. Kenel,
E. Bianda,
E. Mengotti,
2023,
2023 IEEE International Reliability Physics Symposium (IRPS).
E. Bianda,
E. Mengotti,
U. Grossner,
2023,
2023 35th International Symposium on Power Semiconductor Devices and ICs (ISPSD).
E. Bianda,
E. Mengotti,
T. Ziemann,
2022,
IEEE International Reliability Physics Symposium.
E. Bianda,
E. Mengotti,
T. Ziemann,
2021,
International Workshop on Thermal Investigations of ICs and Systems.